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Research issues of the research group
At present, the research group coordinates the following researches
At present, the research group collaborates with the following researches
Conferences
Upcoming
- European Advanced Equipment Control / Advanced Process Control (AEC-APC '10)
April 28 - 30, 2010 (Catania, Italy)
- IEEE Instrumentation and Measurement Technology Conference (IMTC '10)
May 3 - 6, 2010 (Austin, TX, USA)
Past
- IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement (AMUEM '09)
July 6 - 7, 2009 (Bucharest, Romania)
- IEEE International Workshop on Medical Measurements and Applications (MEMEA '09)
May 29 - 30, 2009 (Cetraro, Cosenza, Italy)
- Metrologia e Qualità (MeQ '09)
April 7 - 9, 2009 (Torino, Italy)
- Advanced Concepts for Intelligent Vision Systems (ACIVS '08)
October 20 - 24, 2008 (Juan-les-Pins, France)
A. Mencattini, G. Rabottino, M. Salmeri, R. Lojacono, E. Colini, "Breast mass segmentation in mammographic images by an effective region growing algorithm".
- IMEKO TC4 Symposium (IMEKOTC4 '08)
September 22 - 24, 2008 (Firenze, Italy)
- IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement (AMUEM '08)
July 21 - 22, 2008 (Sardagna, Trento, Italy)
- International Conference on Nuclear Microprobe Technology and Applications (ICNMTA '08)
July 20 - 25, 2008 (Debrecen, Hungary)
D. Bisello, S. Bertazzoni, P. Giubilato, S. Mattiazzo, L. Mongiardo, M. Nigro, D. Pantano, R. Rando, M. Salmeri, L. Silvestrin, M. Tessaro, J. Wiss, "Detection Efficiency and Spatial Resolution of the SIRAD Ion Electron Emission Microscope".
- Symposium on Radiation Measurements and Applications (SORMA '08)
June 2 - 5, 2008 (Berkeley, CA, USA)
D. Bisello, S. Bertazzoni, A. Candelori, P. Giubilato, A. Kaminsky, S. Mattiazzo, L. Mongiardo, M. Nigro, D. Pantano, R. Rando, M. Salmeri, A. Salsano, L. Silvestrin, M. Tessaro, J. Wyss, "Ion Impact Detection and Micromapping with a SIRAD for IEEM Diagnostics and Applications".
- EFOMP European Conference on Medical Physics (EFOMP '07)
September 20 - 22, 2007 (Castelvecchio Pascoli, Lucca, Italy)
- IMEKO Workshop on ADC and DAC Modelling and Testing (IWADC '07)
September 19 - 21, 2007 (Iasi, Romania)
- IEEE International Conference on Fuzzy Systems (FUZZY '07)
July 23 - 26, 2007 (London, UK)
- IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement (AMUEM '07)
July 16 - 18, 2007 (Sardagna, Trento, Italy)
- IMEKO Workshop on ADC and DAC Modelling and Testing (IWADC '06)
September 17 - 22, 2006 (Rio de Janeiro, Brazil)
- IEEE Instrumentation and Measurement Technology Conference (IMTC '06)
April 24 - 27, 2006 (Sorrento, Italy)
- IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement (AMUEM '06)
April 20 - 21, 2006 (Sardagna, Trento, Italy)
- European Conference on Radiation and its Effects on Devices and Systems (RADECS '05)
October 19 - 23, 2005 (Cap d'Agde, France)
S. Bertazzoni, D. Di Giovenale, L. Mongiardo, M. Salmeri, A. Mencattini, A. Salsano, D. Bisello, A. Candelori, P. Giubilato, A. Kaminski, M. Nigro, R. Rando, J. Wyss, S. Lora, " TID and SEE characterization and damaging analysis of 256 Mbit COTS SDRAM for IEEM application".
- IEEE International Conference on Image Processing (ICIP '05)
October 11 - 14, 2005 (Genova, Italy)
- IMEKO TC4 Symposium (IMEKOTC4 '05)
September 12 - 15, 2005 (Gdynia, Poland)
- IEEE International Conference on Computational Intelligence for Measurements Systems and Applications (CIMSA '05)
July 20 - 22, 2005 (Giardini Naxos, Italy)
- Italian Workshop on Neural Network (WIRN '05)
June 8 - 11, 2005 (Vietri sul Mare, Italy)
- IEEE International Workshop on Advances in Sensors and Interfaces (IWASI '05)
April 19 - 20, 2005 (Bari, Italy)
- IEEE Aerospace Conference (AERO '05)
March 5 - 12, 2005 (Big Sky, MT, USA)
- Integrated Non-linear Microwave and Millimetre-wave Circuits Workshop (INMMIC '04)
November 2004 (Monteporzio Catone, Italy)
- IEEE Nuclear Science Symposium (NSSMIC '04)
October 16 - 22, 2004 (Roma, Italy)
- IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTVS '04)
October 11 - 13, 2004 (Cannes, France)
- European Conference on Radiation and its Effects on Devices and Systems (RADECS '02)
September 19 - 20, 2002 (Padova, Italy)
- IEEE International Conference on Image Processing (ICIP '01)
October 7 - 10, 2001 (Thessaloniki, Greece)
- European Conference on Radiation and its Effects on Devices and Systems (RADECS '00)
September 11 - 13, 2000 (Lauvain-la-Neuve, Belgium)
S. Bertazzoni, G.C. Cardarilli, M. Salmeri, A. Salsano, G. Bacis, C.M. Golla, M.L. Longo, D. Di Giovenale, G.C. Grande, S. Sperandei, M. Ricci, P.G. Picozza, " TID Test on 16 Mbit Flash Memories".
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